Operating Procedure for CM200 TEM
Tuesday, August 28th, 2007Obtain an Image:
- Start Up — Liquid Nitrogen; High Tension; Filament (3.8)
- Beam Alignment (without a specimen in the holder or without inserting the holder) — 17,500x
- Gun Tilt (Maximise brightness of incident beam) — Focus beam (INTENSITY); Spread beam to ~3 cm diameter; Maximise screen brightness using MULTIFUNCTION X and Y; Recenter the beam using SHIFT X and Y
- Gun Shift (performed if changing the spot size produce a significant beam shift) — LOW DOSE and EXPOSURE MODE; Spot size 9; Focus beam (INTENSITY) and center spot using SHIFT X and Y; Spot size 3 (or 1&2); Center spot using MULTIFUNCTION X and Y
- Condenser Aperture Alignment — The center of the beam do not move as we change magnification
- Loading a Specimen
- Insert a Specimen
- Searching for an Area of Interest
- Setting Eucentric Height
- Check the Beam Tilt Alignment at 100,000x and if necessary do a further alignment
- Condenser Beam Astigmatism — Make the beam as circular as possible OR Obtain a cleanest, roundest de-saturated filament image
- Image Alignment — 100,000x
- Pivot Point Alignment (performed if a shift of the beam is accompanied by a tilt, or vice versa; OBJECTIVE APERTURE can be used to protect your specimen) — Set the magnification to ~ Bring the two beams together
- Rotation Center Alignment (including VOLTAGE CENTERING or CURRENT CENTERING; performed if the image moves out of center during focusing) — FOCUS STEP 5 or 6 –> FOCUS STEP 7 or 8; minimise image movement using MULTIFUNCTION X and Y
- Image shift (performed if changing the magnification setting produce movement of the beam or of the image) — High SA magnification –> Highest SA magnification –> High M magnification –> lowest M magnification; Focus image and center beam; center the image feature with MULTIFUNCTION X and Y
- Coma x,y Pivot Point Alighment — Coma free, then PP coma x,y superimpose beams
- Coma Free — match image contrast for both tilt
- Centering the OBJECTIVE LENS APERTURE
- Focusing an Image — Focusing an image using the WOBBLER pushbutton (optional) — Adjust the direction of the wobbler to be perpendicular to the direction of the structures to be focussed using the MULTIFUNCTION X; Insert a specimen, adjust the height and focus the image; Press D pushbutton; Select a camera length of approximately 600 nm; Focus the illumination using the INTENSITY knob; Ensure that the objective aperture is correctly centered; Press WOBBLER pushbutton to get two spots within the area of the objective aperture using MULTIFUNCTION Y; Press D pushbutton and focus the image to minimal blur; Press WOBBLER pushbutton to switch off
- Fine Adjusting an Image — Image (Objective) Astigmatism — Amorphous area; 100,000x; Live FFT; Concentric circles
- Setting Exposure Time
- Take a Picture
- End Up: High Tension; Filament
Obtain a Diffraction Pattern
- Diffraction Alignment — Camera length from shortest to longest, Focus diffraction pattern (FOCUS) and center central beam spot using MULTIFUNCTION X and Y
- Diffraction Shift — Center diffraction pattern using MULTIFUNCTION X and Y
- Correcting diffraction pattern astigmatism in SA diffraction mode — Obtain a TEM BF image of a specimen in SA magnification; Remove specimen and objective aperture from the beam; Press D and adjust the MAGNIFICATION knob to obtain the required camera length; Set SPOT SIZE to 4; Turn INTENSITY knob until low illumination intensity is obtained on the screen; Adjust FUCOS until the diffraction crossover image is obtained; Press STIG button and try to get a symmetrical 3-pointed image using MULTIFUNCTION X and Y
Obtain a Microdiffraction Pattern
- Center selected area of specimen on screen
- Choose appropriate spot size (C1); Focus beam to crossover (C2) and positon on selected area
- Go to D; remove OA
- Vary C2 aperture to change size of diffraction disks. For every small beamsize/selected areas it may be necessary to slightly reposition beam or recenter aperture after changing C2 aperture. Observe in M mode to determine if this is necessary
- Do not insert SAD aperture
X-ray Analysis
- Locate the region of interest in the center of the TEM viewing screen
- Remove the objective aperture
- Insert Condenser aperture 3. Align the Aperture
- Tilt the specimen toward the detector by increasing the ą-tilt to approximately +20o
- Reduce the spot size to spot size 4
- Position the beam over the area of interest using INTENSITY and BEAM SHIFT Knobs
- Insert the EDS detector by pressing the button on the software window
- Make the COUNT RATE >1000cps <4000>
